Non destructive testing methods based on Terahertz radiation and Compressive Sampling

A research contribution on non-destructive and non-invasive testing on avionics, metal and non-metal materials is presented. This is realized exploiting the combination of two topics, which over time have become increasingly popular, such as: Compressive Sampling and THz radiation. Specifically, an innovative approach has been developed, so-called CS-THz, that combines the possibility of irradiating with T-waves the sample under test and then realizing the process of capturing and reconstructing of the image through the CS principles. For this purpose, a CS-THz model has been developed, first studying with simulated tests and then with a campaign of experimental trials as the uncertainty sources at stake and their effects on reconstruction, expanding the study introducing a metrics of indexes quality. In addition, the results of Spectroscopy and Imaging THz applications are shown, in the various configurations (reflection and transmission) in which the THz system can operate and the results of non-invasive and non-destructive tests on ferromagnetic materials studied with the method of induced currents, and on which the principles of CS have been applied in order to be able to make the phases of reconstructions of the acquired electrical signal faster by exploiting graphic units (GPUs) and CUDA.