STRUCTURAL INVESTIGATION OF THIN FILMS: FROM METAL HETEROSTRUCTURES TO METAL/ORGANIC SYSTEMS

We have used GIXRD and PED to fully characterize the evolution of the two phases as a function of the thickness. A critical value of l O layers has been determined as the onset for the transition to the bulk phase. The morphology and the distribution of the two species of the system has been determined. GIXRD scans analysis puts in evidence how the transition, accompanied by a strong increase of the intermixing at the Ni/Pd interface, proceeds by the lateral growth of the Ni fcc domains at the expense of the pseudomorphic phase. 2.The structural characterization of a thin Copper-Phthalocyanine (CuPc) fàƒ¹m grown on Au(llO) surface. Metal-Phthalocyanines films are among the most promising organic semiconductors devices for applications in electronics, solar celis, gas sensors. Their transport properties can be improved by optimizing the film morphology, which depends on the interface structure; for this reason the study of the early stages of deposition of CuPc on metals is relevant for possible applications. W e have studied the structure of a thin Cu-Pc film on the Au(llO) surface by means of HAS, LEED, NEXAFS and GIXRD as a function of thickness in the 0-2 monolayer range. W e have shown how different reconstructions are induced by the interaction between the molecules and the substrate as a function of the film thickness. In particular, two phases have been studied displaying different reconstructions along the [l 00] direction of the surface: a x5 reconstruction is present in the submonolayer range; at the monolayer coverage a x3 phase appears. GIXRD measurements allowed to determine